确定晶界平面段的统计方法

N. Kondratev, E. Makarevich, A. Podsedertsev
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引用次数: 0

摘要

提出了一种考虑其拓扑结构来确定晶界(晶粒或亚晶粒)平面截面的方法。基于平均实验数据的近似,假设椭球状晶体的形状是已知的。提出了考虑椭球体形状确定晶界平面截面的面积、方向和空间位置的统计问题。为了解决这一问题,尝试确保两个条件的满足。第一个是沿椭球体表面的平截面边界应具有近似均匀的分布。第二,在椭球表面曲率最大的地方,面积最小的切面密度增加。考虑到材料的结构,上述条件为实现已开发的统计多层模型提供了椭球体的平截面近似的必要条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Statistical method for determining the flat segments of boundaries for crystallites
A method for specifying flat sections of crystallite boundaries (grains or sub-grains), taking into consideration their topology, is proposed. The shape of crystallites in the form of ellipsoids is assumed to be known based on the approximation of averaged experimental data. A statistical problem on the determination of flat sections of grain boundaries, the area, orientation and position in space of which are found taking into account the shape of the prescribed ellipsoid, is formulated. To solve this problem, an attempt to ensure the fulfillment of two conditions is made. The first one is flat sections of the boundary along the surface of the ellipsoid should have an approximately uniform distribution. The second one is that in places of the greatest curvature of the ellipsoid surface there is an increased density of facets with the smallest area. The noted conditions provide the necessary approximation of the ellipsoid by flat sections for the implementation of the developed statistical multilevel models, taking into consideration the structure of the material.
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