{"title":"低成本近红外测量装置","authors":"Luka Mustafa, Eva Cerncic","doi":"10.1109/IWOW.2015.7342280","DOIUrl":null,"url":null,"abstract":"Due to lack of low-cost near infra-red measurement devices for spatial beam profiling in free-space optical systems, a custom solution is developed, utilizing commercially available PIN+TIA detector and limiting amplifier, that are primarily used in SFP optical modules.","PeriodicalId":247164,"journal":{"name":"2015 4th International Workshop on Optical Wireless Communications (IWOW)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low-cost NIR measurement device\",\"authors\":\"Luka Mustafa, Eva Cerncic\",\"doi\":\"10.1109/IWOW.2015.7342280\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to lack of low-cost near infra-red measurement devices for spatial beam profiling in free-space optical systems, a custom solution is developed, utilizing commercially available PIN+TIA detector and limiting amplifier, that are primarily used in SFP optical modules.\",\"PeriodicalId\":247164,\"journal\":{\"name\":\"2015 4th International Workshop on Optical Wireless Communications (IWOW)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 4th International Workshop on Optical Wireless Communications (IWOW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWOW.2015.7342280\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 4th International Workshop on Optical Wireless Communications (IWOW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWOW.2015.7342280","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Due to lack of low-cost near infra-red measurement devices for spatial beam profiling in free-space optical systems, a custom solution is developed, utilizing commercially available PIN+TIA detector and limiting amplifier, that are primarily used in SFP optical modules.
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