测量条件对亚太赫兹频率范围内材料表征精度的影响研究

2016 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) Pub Date : 2016-05-09 DOI:10.1109/MIKON.2016.7491939

K. Godziszewski, Y. Yashchyshyn

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引用次数: 5

摘要

本文介绍了测量条件对亚太赫兹范围内材料表征精度影响的研究结果。不同的制造问题以及计量方面的考虑。研究集中在LTCC材料作为新兴技术，可用于开发多层亚太赫兹器件。仿真和实验研究表明，适当的测量装置和被测样品的制备是实现高测量精度的关键。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Investigation of influence of measurement conditions on accuracy of material characterization in sub-THz frequency range

In this paper results of investigations of the influence of measurement conditions on the accuracy of material characterization in sub-THz range were presented. Different fabrication issues as well as metrological aspects were taken into account. Studies were focused on LTCC materials as emerging technology that can be used in developing of multilayer sub-terahertz devices. Simulation and experimental studies showed that appropriate preparation of measurement setup and samples under test are key elements to achieve high measurement accuracy.

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2016 21st International Conference on Microwave, Radar and Wireless Communications (MIKON)

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