使用氟掺杂金属氧化物的高性能溶液处理薄膜晶体管

M. Miyakawa, M. Nakata, H. Tsuji, Y. Fujisaki
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引用次数: 1

摘要

使用金属氧化物半导体的溶液加工氧化物薄膜晶体管(TFTs)在以相对较低的成本生产大面积电子产品方面非常有前途。本研究旨在设计和制造在低温300℃下使用氟掺杂金属氧化物溶液处理的高性能tft。我们研究了用氟添加剂掺杂活性通道层的IGZO和IZO的简单方法对制备的TFT性能的影响。此外,对被认为对薄膜致密化有效的氢注入和氧化方法进行了测试,发现可以改善TFT的电学性能。这种简单的低温制造技术将用于制造大面积tft。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-performance solution-processed thin-film transistors using fluorine-doped aqueous metal oxides
Simple and facile solution-processed oxide thin-film transistors (TFTs) using metal-oxide semiconductors are very promising for producing large-area electronics at a relatively low cost. This study aims to design and fabricate high-performance solution-processed TFTs using fluorine-doped aqueous metal oxides at a low temperature of 300°C. We investigated the effect of a simple method of doping the IGZO and IZO used for the active-channel layer with fluorine additives on the performance of the fabricated TFT. In addition, the hydrogen injection and oxidation method, which is considered effective for film densification, was tested and found to improve the electrical performance of the TFT. This simple, low-temperature fabrication technique will be useful for manufacturing large-area TFTs.
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