{"title":"基于改进六端口技术的前向v波段矢量网络分析仪","authors":"K. Haddadi, T. Lasri","doi":"10.1109/WISNET.2015.7127400","DOIUrl":null,"url":null,"abstract":"A V-band forward network analyzer based on a modified six-port technique is proposed for the measurement of complex reflection (S11) and transmission (S21) coefficients. The millimeter-wave part of the system is implemented on a thin alumina ceramic substrate. The measurement performance is evaluated by comparing the results obtained from the system proposed to those given by a conventional network analyzer in the frequency band 55-65 GHz.","PeriodicalId":293397,"journal":{"name":"2015 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Forward V-band vector network analyzer based on a modified six-port technique\",\"authors\":\"K. Haddadi, T. Lasri\",\"doi\":\"10.1109/WISNET.2015.7127400\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A V-band forward network analyzer based on a modified six-port technique is proposed for the measurement of complex reflection (S11) and transmission (S21) coefficients. The millimeter-wave part of the system is implemented on a thin alumina ceramic substrate. The measurement performance is evaluated by comparing the results obtained from the system proposed to those given by a conventional network analyzer in the frequency band 55-65 GHz.\",\"PeriodicalId\":293397,\"journal\":{\"name\":\"2015 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WISNET.2015.7127400\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WISNET.2015.7127400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Forward V-band vector network analyzer based on a modified six-port technique
A V-band forward network analyzer based on a modified six-port technique is proposed for the measurement of complex reflection (S11) and transmission (S21) coefficients. The millimeter-wave part of the system is implemented on a thin alumina ceramic substrate. The measurement performance is evaluated by comparing the results obtained from the system proposed to those given by a conventional network analyzer in the frequency band 55-65 GHz.