S. Kwak, J. Jo, Seok-Ho Noh, HyeSook Lee, W. Nah, Soyoung Kim
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Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs
This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.
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