大气和空间辐射对敏感电子设备的影响

Lucas Matana Luza, F. Wrobel, L. Entrena, L. Dilillo
{"title":"大气和空间辐射对敏感电子设备的影响","authors":"Lucas Matana Luza, F. Wrobel, L. Entrena, L. Dilillo","doi":"10.1109/ETS54262.2022.9810454","DOIUrl":null,"url":null,"abstract":"Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to their crucial role, memories and processors are the highest contributors to soft errors in systems, making them the best candidates for studying these effects. This work introduces the radiation environment in space and atmosphere and the main effects that the different types of ionizing particles that are present in these environments may produce on electronic devices. Furthermore, mainly focusing on Single-Event Effects (SEEs), it presents approaches and tools for modeling SEEs and their impact on memories and microprocessors. Additionally, experimental results targeting a Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented. These experiments are based on radiation test campaigns in particle accelerators with neutrons and protons. Finally, an overview of issues and mitigation techniques for microprocessors is exposed.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices\",\"authors\":\"Lucas Matana Luza, F. Wrobel, L. Entrena, L. Dilillo\",\"doi\":\"10.1109/ETS54262.2022.9810454\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to their crucial role, memories and processors are the highest contributors to soft errors in systems, making them the best candidates for studying these effects. This work introduces the radiation environment in space and atmosphere and the main effects that the different types of ionizing particles that are present in these environments may produce on electronic devices. Furthermore, mainly focusing on Single-Event Effects (SEEs), it presents approaches and tools for modeling SEEs and their impact on memories and microprocessors. Additionally, experimental results targeting a Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented. These experiments are based on radiation test campaigns in particle accelerators with neutrons and protons. Finally, an overview of issues and mitigation techniques for microprocessors is exposed.\",\"PeriodicalId\":334931,\"journal\":{\"name\":\"2022 IEEE European Test Symposium (ETS)\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS54262.2022.9810454\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810454","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

研究辐射对电子设备的影响对航空电子和空间系统至关重要。技术节点的缩小和器件密度的增加提高了电子系统对电离辐射的敏感性。由于它们的关键作用,存储器和处理器是系统中软错误的最大贡献者,使它们成为研究这些影响的最佳候选者。本文介绍了空间和大气中的辐射环境,以及这些环境中存在的不同类型的电离粒子可能对电子设备产生的主要影响。此外,主要关注单事件效应(SEEs),它提出了建模see及其对存储器和微处理器的影响的方法和工具。此外,还介绍了针对商用现货自刷新动态RAM的实验结果。这些实验是基于中子和质子粒子加速器的辐射测试活动。最后,概述了微处理器的问题和缓解技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to their crucial role, memories and processors are the highest contributors to soft errors in systems, making them the best candidates for studying these effects. This work introduces the radiation environment in space and atmosphere and the main effects that the different types of ionizing particles that are present in these environments may produce on electronic devices. Furthermore, mainly focusing on Single-Event Effects (SEEs), it presents approaches and tools for modeling SEEs and their impact on memories and microprocessors. Additionally, experimental results targeting a Commercial-Off-The-Shelf self-refresh Dynamic RAM are presented. These experiments are based on radiation test campaigns in particle accelerators with neutrons and protons. Finally, an overview of issues and mitigation techniques for microprocessors is exposed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信