{"title":"无铅电子产品的坚固性和可靠性","authors":"J. E. Starr","doi":"10.1109/RAMS.2010.5447988","DOIUrl":null,"url":null,"abstract":"Little is understood about the behavior of new lead-free solders in harsh mechanical environments (shock and vibration). There is an interest in scientific understanding of the impact of lead-free electronics and an interest in mitigating lead-free reliability risks. Reliability under harsh environments has two primary needs - 1) ability to ruggedize the product for the expected environment and 2) ability to effectively screen to prevent production flawed parts from being shipped.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ruggedness and reliability of lead free electronics\",\"authors\":\"J. E. Starr\",\"doi\":\"10.1109/RAMS.2010.5447988\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Little is understood about the behavior of new lead-free solders in harsh mechanical environments (shock and vibration). There is an interest in scientific understanding of the impact of lead-free electronics and an interest in mitigating lead-free reliability risks. Reliability under harsh environments has two primary needs - 1) ability to ruggedize the product for the expected environment and 2) ability to effectively screen to prevent production flawed parts from being shipped.\",\"PeriodicalId\":299782,\"journal\":{\"name\":\"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)\",\"volume\":\"128 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2010.5447988\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2010.5447988","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ruggedness and reliability of lead free electronics
Little is understood about the behavior of new lead-free solders in harsh mechanical environments (shock and vibration). There is an interest in scientific understanding of the impact of lead-free electronics and an interest in mitigating lead-free reliability risks. Reliability under harsh environments has two primary needs - 1) ability to ruggedize the product for the expected environment and 2) ability to effectively screen to prevent production flawed parts from being shipped.