极值理论在SRAM数据保留电压最坏情况统计分析中的应用

2019 Silicon Nanoelectronics Workshop (SNW) Pub Date : 2019-06-01 DOI:10.23919/SNW.2019.8782900

T. Mizutani, K. Takeuchi, T. Saraya, M. Kobayashi, T. Hiramoto

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引用次数: 1

摘要

将极值理论应用于SRAM最坏情况下的数据保持电压估计。研究发现，最坏情况下的DRV遵循Gumbel分布，可以通过测量几个SRAM阵列的最坏情况DRV而不是全部来估计。

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Application of Extreme Value Theory to Statistical Analyses of Worst Case SRAM Data Retention Voltage

Extreme value theory was applied to the estimation of worst case SRAM data retention voltage (DRV). It was found that the worst case DRV follows Gumbel distributions, and can be estimated by measuring not all, but only the worst case DRV of several SRAM arrays.

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2019 Silicon Nanoelectronics Workshop (SNW)

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