K. Shida, T. Wada, H. Nishinaka, K. Segawa, T. Igarashi
{"title":"基于ETL可计算电容的量化霍尔电阻SI值","authors":"K. Shida, T. Wada, H. Nishinaka, K. Segawa, T. Igarashi","doi":"10.1109/CPEM.1988.671308","DOIUrl":null,"url":null,"abstract":"SI value of quantized Hall resistanee based on ETL's calculable capacitor is presented. Some improvements of previous measurement systems were prooeeded and some parts of the measurement techniques were changed. The measurements are now in progress. We will present more reliable results than the previous one in CPEM'88.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SI Value of Qunatized Hall Resistance Based on ETL's Calculable Capacitor\",\"authors\":\"K. Shida, T. Wada, H. Nishinaka, K. Segawa, T. Igarashi\",\"doi\":\"10.1109/CPEM.1988.671308\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SI value of quantized Hall resistanee based on ETL's calculable capacitor is presented. Some improvements of previous measurement systems were prooeeded and some parts of the measurement techniques were changed. The measurements are now in progress. We will present more reliable results than the previous one in CPEM'88.\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671308\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671308","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SI Value of Qunatized Hall Resistance Based on ETL's Calculable Capacitor
SI value of quantized Hall resistanee based on ETL's calculable capacitor is presented. Some improvements of previous measurement systems were prooeeded and some parts of the measurement techniques were changed. The measurements are now in progress. We will present more reliable results than the previous one in CPEM'88.