Chun-You Liu, Ming-Huang Li, H. Ranjith, Sheng-Shian Li
{"title":"1 MHz 4 ppm CMOS-MEMS振荡器,内置自检和亚毫瓦加热功率","authors":"Chun-You Liu, Ming-Huang Li, H. Ranjith, Sheng-Shian Li","doi":"10.1109/IEDM.2016.7838488","DOIUrl":null,"url":null,"abstract":"A 1 MHz 4 ppm temperature-stable micro-oven μOven) controlled monolithic CMOS-MEMS oscillator has been demonstrated in this work, exhibiting heating power in sub-mW across the 100°C temperature span. The proposed novel isothermal μOven platform consists of dual heaters, one of which stabilizes the resonator temperature while the other of which serves as built-in self-test (BIST) to mimic ambient temperature, and a resistive temperature detector (RTD) for local resonator temperature monitoring. By adapting the constant-resistance (CR) feedback temperature control scheme, the integrated 1 MHz CMOS-MEMS oscillator shows a maximum frequency inaccuracy of only 4 ppm during a fast temperature ramp across the 94°C testing span (i.e., < 43 ppb/°C). The oscillator circuit shows a worst-case bias instability of 60 ppb and phase noise (PN) of −105 dBc/Hz at 1-kHz offset (Q = 1,700).","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A 1 MHz 4 ppm CMOS-MEMS oscillator with built-in self-test and sub-mW ovenization power\",\"authors\":\"Chun-You Liu, Ming-Huang Li, H. Ranjith, Sheng-Shian Li\",\"doi\":\"10.1109/IEDM.2016.7838488\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 1 MHz 4 ppm temperature-stable micro-oven μOven) controlled monolithic CMOS-MEMS oscillator has been demonstrated in this work, exhibiting heating power in sub-mW across the 100°C temperature span. The proposed novel isothermal μOven platform consists of dual heaters, one of which stabilizes the resonator temperature while the other of which serves as built-in self-test (BIST) to mimic ambient temperature, and a resistive temperature detector (RTD) for local resonator temperature monitoring. By adapting the constant-resistance (CR) feedback temperature control scheme, the integrated 1 MHz CMOS-MEMS oscillator shows a maximum frequency inaccuracy of only 4 ppm during a fast temperature ramp across the 94°C testing span (i.e., < 43 ppb/°C). The oscillator circuit shows a worst-case bias instability of 60 ppb and phase noise (PN) of −105 dBc/Hz at 1-kHz offset (Q = 1,700).\",\"PeriodicalId\":186544,\"journal\":{\"name\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2016.7838488\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 1 MHz 4 ppm CMOS-MEMS oscillator with built-in self-test and sub-mW ovenization power
A 1 MHz 4 ppm temperature-stable micro-oven μOven) controlled monolithic CMOS-MEMS oscillator has been demonstrated in this work, exhibiting heating power in sub-mW across the 100°C temperature span. The proposed novel isothermal μOven platform consists of dual heaters, one of which stabilizes the resonator temperature while the other of which serves as built-in self-test (BIST) to mimic ambient temperature, and a resistive temperature detector (RTD) for local resonator temperature monitoring. By adapting the constant-resistance (CR) feedback temperature control scheme, the integrated 1 MHz CMOS-MEMS oscillator shows a maximum frequency inaccuracy of only 4 ppm during a fast temperature ramp across the 94°C testing span (i.e., < 43 ppb/°C). The oscillator circuit shows a worst-case bias instability of 60 ppb and phase noise (PN) of −105 dBc/Hz at 1-kHz offset (Q = 1,700).