从正式的规格说明到高效的测试场景生成

Jing Yang, M. Ghazel, E. El-Koursi
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引用次数: 1

摘要

在过去的几十年里,各种形式的测试方法得到了发展。它们中的大多数都是基于图形符号,如有限状态机,标记转换系统等,这对于用户执行黑盒测试来说仍然是非常直观的。此外,还研究了基于时间逻辑的测试方法,如基于模型检验的测试方法。然而,使用模型检查器进行测试通常需要知道被测系统(System Under Test, SUT)的模型。本文讨论了一种在黑盒框架下,由CTL*时态逻辑表示的规范生成测试用例的方法。CTL*的测试生成过程受到Banerjee等人的工作[1]的启发,该工作开发了一种从LTL属性生成非真空测试场景的技术。我们的测试生成方法的基本步骤是根据当前状态布尔命题和X(Next)保护的时间属性重写相关的CTL*属性。生成的测试台在ControlBuild工具中实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
From formal specifications to efficient test scenarios generation
Various formal testing methods have been developed in the past decades. Most of them are based on graphical notations such as finite state machines, labelled transitions systems, etc., which remain quite intuitive for users to perform black box testing. In addition, testing methods based on temporal logics have been also investigated, such as the testing methods inspired by model checking. However, testing with model checkers often needs a model of System Under Test (SUT) to be known. This paper discusses a method for generating test cases from specifications expressed in CTL* temporal logic, under a black-box framework. The test generation process from CTL* is inspired by Banerjee et al.'s work [1] which has developed a technique to generate non-vacuous test scenarios from LTL properties. The essential step of our test generation method is to rewrite a pertinent CTL* property in terms of present state Boolean propositions and X(Next)-guarded temporal properties. The generated test benches are implemented within the ControlBuild tool.
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