窄阱宽InGaAs/InP单量子阱的温度依赖性光致发光研究

W. Pecharapa, W. Techitheera, P. Thanomgam, J. Nukeaw
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引用次数: 1

摘要

通过光致发光光谱验证了金属气相外延生长出窄阱宽的In0.53Ga0.47As/InP单量子阱。PL谱在井中表现为e(1)-hh(1)跃迁。在15K到200K的不同温度下进行了PL测量,以研究该结构的重要温度依赖参数。得到了决定光致发光猝灭和展宽机理的重要参数,如活化能。由于窄阱中的热活化能很小,只有15.1 meV,载流子可以从阱中逃逸到势垒态。温度对发光峰宽度的影响表明,非均匀机制是发光峰展宽的主要机制,而在高温下,由于电子-声子相互作用,发光峰展宽的主要机制是均匀机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Temperature-dependent photoluminescence investigation of narrow well-width InGaAs/InP single quantum well
The formation of In0.53Ga0.47As/InP single quantum well with narrow well width grown by Organometallic Vapor Phase Epitaxy is verified by photoluminescence spectroscopy. PL spectra exhibit the e(1)-hh(1) transition in the well. PL measurement was conducted at various temperatures from 15K to 200K in order to investigate the important temperature-dependent parameters of this structure. Important parameters such as activation energies responsible for the photoluminescence quenching and broadening mechanisms are achieved. Because of small thermal activation energy of 15.1 meV in the narrow well, carriers can escape from the well to the barrier states. The dependence of PL width on temperature revealed that Inhomogeneous mechanism is the dominant mechanism for the broadening of PL peak and homogeneous mechanism is responsible at high temperature due to electron-phonon interaction.
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