{"title":"光束光学分析仪的最新进展","authors":"T. Bui, C. Mckenzie, R. Ives","doi":"10.1109/IVEC45766.2020.9520467","DOIUrl":null,"url":null,"abstract":"Recent advances in Beam Optics Analyzer include anisotropic materials implemented within the finite element framework, higher order interpolation for thermal and stress analyses, and smoother, more efficient shapelets method to construct current density on 3D surfaces","PeriodicalId":170853,"journal":{"name":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent Advances in Beam Optics Analyzer\",\"authors\":\"T. Bui, C. Mckenzie, R. Ives\",\"doi\":\"10.1109/IVEC45766.2020.9520467\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recent advances in Beam Optics Analyzer include anisotropic materials implemented within the finite element framework, higher order interpolation for thermal and stress analyses, and smoother, more efficient shapelets method to construct current density on 3D surfaces\",\"PeriodicalId\":170853,\"journal\":{\"name\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC45766.2020.9520467\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC45766.2020.9520467","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Recent advances in Beam Optics Analyzer include anisotropic materials implemented within the finite element framework, higher order interpolation for thermal and stress analyses, and smoother, more efficient shapelets method to construct current density on 3D surfaces
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