短时电流测试中绕组变形的检测

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI:10.1109/IMTC.2005.1604100

S. Santhi, S. Jayalalitha, V. Jayashankar, V.J. Kumar

{"title":"短时电流测试中绕组变形的检测","authors":"S. Santhi, S. Jayalalitha, V. Jayashankar, V.J. Kumar","doi":"10.1109/IMTC.2005.1604100","DOIUrl":null,"url":null,"abstract":"Transformers are required to demonstrate the ability to withstand short circuit currents. Over currents due to short circuit can cause winding deformation. A new method of testing and analyzing winding deformation online without untanking is presented in this paper. A study of alternate excitations to detect winding deformation is made. A comparison of Fourier transform and Wigner-Ville distribution methods of analysis is carried out","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Detection of Winding Deformations During Short Time Current Tests\",\"authors\":\"S. Santhi, S. Jayalalitha, V. Jayashankar, V.J. Kumar\",\"doi\":\"10.1109/IMTC.2005.1604100\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transformers are required to demonstrate the ability to withstand short circuit currents. Over currents due to short circuit can cause winding deformation. A new method of testing and analyzing winding deformation online without untanking is presented in this paper. A study of alternate excitations to detect winding deformation is made. A comparison of Fourier transform and Wigner-Ville distribution methods of analysis is carried out\",\"PeriodicalId\":244878,\"journal\":{\"name\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"volume\":\"97 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2005.1604100\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2005.1604100","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

要求变压器具有抗短路电流的能力。短路引起的过电流会导致绕组变形。提出了一种不拆罐在线检测和分析卷绕变形的新方法。研究了交替激励检测绕组变形的方法。对傅里叶变换和维格纳-维尔分布分析方法进行了比较

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Detection of Winding Deformations During Short Time Current Tests

Transformers are required to demonstrate the ability to withstand short circuit currents. Over currents due to short circuit can cause winding deformation. A new method of testing and analyzing winding deformation online without untanking is presented in this paper. A study of alternate excitations to detect winding deformation is made. A comparison of Fourier transform and Wigner-Ville distribution methods of analysis is carried out

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2005 IEEE Instrumentationand Measurement Technology Conference Proceedings

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