E. Matoglu, Madhavan Swaminathan, M. Cases, Nam H. Pham, D. N. D. Araujo
{"title":"运用统计方法对高速客车的设计空间进行探索","authors":"E. Matoglu, Madhavan Swaminathan, M. Cases, Nam H. Pham, D. N. D. Araujo","doi":"10.1109/EPEP.2003.1249991","DOIUrl":null,"url":null,"abstract":"This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design space exploration of high-speed busses using statistical methods\",\"authors\":\"E. Matoglu, Madhavan Swaminathan, M. Cases, Nam H. Pham, D. N. D. Araujo\",\"doi\":\"10.1109/EPEP.2003.1249991\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.\",\"PeriodicalId\":254477,\"journal\":{\"name\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2003.1249991\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1249991","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design space exploration of high-speed busses using statistical methods
This paper presents an efficient statistical method to increase the data rate of local I/O bus. Parametric yield of the PCI-X has been computed at a higher data rate. Then yield loss at higher data rate has been recovered by making the most feasible and effective adjustments. Instead of full factorial signal integrity analysis, sensitivity relations and statistical distributions of signal integrity measures have been computed, which supply detailed information to designers and manufacturers.