Xinwei Liu, Marius Pedersen, C. Charrier, Patrick A. H. Bours
{"title":"无参考图像质量指标可以评估可见波长虹膜样品质量吗?","authors":"Xinwei Liu, Marius Pedersen, C. Charrier, Patrick A. H. Bours","doi":"10.1109/ICIP.2017.8296939","DOIUrl":null,"url":null,"abstract":"The overall performance of iris recognition systems is affected by the quality of acquired iris sample images. Due to the development of imaging technologies, visible wavelength iris recognition gained a lot of attention in the past few years. However, iris sample quality of unconstrained imaging conditions is a more challenging issue compared to the traditional near infrared iris biometrics. Therefore, measuring the quality of such iris images is essential in order to have good quality samples for iris recognition. In this paper, we investigate whether general purpose no-reference image quality metrics can assess visible wavelength iris sample quality.","PeriodicalId":229602,"journal":{"name":"2017 IEEE International Conference on Image Processing (ICIP)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Can no-reference image quality metrics assess visible wavelength iris sample quality?\",\"authors\":\"Xinwei Liu, Marius Pedersen, C. Charrier, Patrick A. H. Bours\",\"doi\":\"10.1109/ICIP.2017.8296939\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The overall performance of iris recognition systems is affected by the quality of acquired iris sample images. Due to the development of imaging technologies, visible wavelength iris recognition gained a lot of attention in the past few years. However, iris sample quality of unconstrained imaging conditions is a more challenging issue compared to the traditional near infrared iris biometrics. Therefore, measuring the quality of such iris images is essential in order to have good quality samples for iris recognition. In this paper, we investigate whether general purpose no-reference image quality metrics can assess visible wavelength iris sample quality.\",\"PeriodicalId\":229602,\"journal\":{\"name\":\"2017 IEEE International Conference on Image Processing (ICIP)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Conference on Image Processing (ICIP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIP.2017.8296939\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Conference on Image Processing (ICIP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIP.2017.8296939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The overall performance of iris recognition systems is affected by the quality of acquired iris sample images. Due to the development of imaging technologies, visible wavelength iris recognition gained a lot of attention in the past few years. However, iris sample quality of unconstrained imaging conditions is a more challenging issue compared to the traditional near infrared iris biometrics. Therefore, measuring the quality of such iris images is essential in order to have good quality samples for iris recognition. In this paper, we investigate whether general purpose no-reference image quality metrics can assess visible wavelength iris sample quality.
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