基于片上系统的单片机- dsp核心的片上调试体系结构

Wang Gang, Zhang Shengbing
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引用次数: 0

摘要

从印刷电路板上的系统(pcb)到片上系统(soc)的迁移已经将越来越多的组件转移到soc上。这种较高集成级别的一个意想不到的副作用是降低了系统的可观察性和可控性,从而导致嵌入式系统开发面临新的调试挑战[1]。本文提出了一种片上调试架构,可以帮助克服这些挑战。片上调试架构集成到基于32位静态超标量MCU-DSP核心的SoC中,包括三个主要组件:JTAG控制器、片上调试模块和核心调试模块。这种模块化架构可以用低硬件开销支持以下典型的调试功能:实时运行控制、动态访问内部寄存器和本地内存、复杂的硬件断点和单步进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On-chip debug architecture for MCU-DSP Core based system-on-chip
The migration from system on printed circuit boards (PCBs) to system-on-chips (SoCs) has moved more and more components onto SoCs. An unintended side effect of this higher integration level is the decreasing system observability and controllability, and consequently resulting in novel debug challenges for embedded system development [1]. This paper presents an on-chip debug architecture that can help conquer the challenges. The on-chip debug architecture is integrated into the 32-bit static superscalar MCU-DSP Core based SoC and includes three main components: the JTAG Controller, the On-chip Debug Module and the Core Debug Module. This modular architecture can support the following typical debug features with low hardware overhead: real-time run control, access internal registers and local memory on the fly, complex hardware breakpoints and single-stepping.
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