微波和毫米波技术表征非接触式亚表面缺陷

{"title":"微波和毫米波技术表征非接触式亚表面缺陷","authors":"M. Maazi, O. Benzaim, K. Haddadi, D. Glay, T. Lasri","doi":"10.1007/S11220-006-0026-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":166802,"journal":{"name":"Sensing and Imaging: An International Journal","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Non-Contact Subsurface Defects Characterization by Microwave and Millimeter Wave Techniques\",\"authors\":\"M. Maazi, O. Benzaim, K. Haddadi, D. Glay, T. Lasri\",\"doi\":\"10.1007/S11220-006-0026-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":166802,\"journal\":{\"name\":\"Sensing and Imaging: An International Journal\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sensing and Imaging: An International Journal\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/S11220-006-0026-3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensing and Imaging: An International Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S11220-006-0026-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}