Xiaodong Wang, B. Wang, Liwei Hou, Wei Xie, Xiaoyao Chen, M. Pan
{"title":"太赫兹应用gaas阻塞杂质带探测器的电特性仿真","authors":"Xiaodong Wang, B. Wang, Liwei Hou, Wei Xie, Xiaoyao Chen, M. Pan","doi":"10.1109/NUSOD.2014.6935340","DOIUrl":null,"url":null,"abstract":"Electrical characteristics of GaAs-based blocked-impurity-band (BIB) detector are numerically studied. Electron density and electric field distributions of the device are presented with consideration of immaturity of GaAs blocking layer. Temperature-dependent dark current characteristics are then simulated by taking into account impurity-band effects.","PeriodicalId":114800,"journal":{"name":"Numerical Simulation of Optoelectronic Devices, 2014","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electrical characteristics simulation of GaAs-based blocked-impurity-band detector for THz application\",\"authors\":\"Xiaodong Wang, B. Wang, Liwei Hou, Wei Xie, Xiaoyao Chen, M. Pan\",\"doi\":\"10.1109/NUSOD.2014.6935340\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical characteristics of GaAs-based blocked-impurity-band (BIB) detector are numerically studied. Electron density and electric field distributions of the device are presented with consideration of immaturity of GaAs blocking layer. Temperature-dependent dark current characteristics are then simulated by taking into account impurity-band effects.\",\"PeriodicalId\":114800,\"journal\":{\"name\":\"Numerical Simulation of Optoelectronic Devices, 2014\",\"volume\":\"83 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Numerical Simulation of Optoelectronic Devices, 2014\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2014.6935340\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Numerical Simulation of Optoelectronic Devices, 2014","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2014.6935340","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical characteristics simulation of GaAs-based blocked-impurity-band detector for THz application
Electrical characteristics of GaAs-based blocked-impurity-band (BIB) detector are numerically studied. Electron density and electric field distributions of the device are presented with consideration of immaturity of GaAs blocking layer. Temperature-dependent dark current characteristics are then simulated by taking into account impurity-band effects.