晶体管泄漏故障的等效故障折叠

Digest of Papers 1996 IEEE International Workshop on IDDQ Testing Pub Date : 1996-10-24 DOI:10.1109/IDDQ.1996.557836

W. Xiaoqing, K. Saluja, K. Kinoshita, H. Tamamoto

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引用次数: 4

摘要

针对I/sub DDQ/测试中常用的晶体管泄漏故障模型，本文提出了一种新颖的等效故障折叠方法。实验结果表明，该方法有效地减少了需要考虑的故障数量，在I/sub DDQ/测试中具有实用性。

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Equivalence fault collapsing for transistor leakage faults

This paper presents an innovative method of equivalence fault collapsing for the transistor leakage faults, a fault model often used in I/sub DDQ/ testing. The experimental results show the effectiveness of the proposed method in reducing the number of faults that have to be considered and its usefulness in I/sub DDQ/ testing.

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Digest of Papers 1996 IEEE International Workshop on IDDQ Testing

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