{"title":"指数分布下竞争风险模型的条件期望","authors":"","doi":"10.1002/9781119664031.app5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Conditional Expectations for Competing Risks Model Under Exponential Distribution\",\"authors\":\"\",\"doi\":\"10.1002/9781119664031.app5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":196639,\"journal\":{\"name\":\"Accelerated Life Testing of One‐shot Devices\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-02-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Accelerated Life Testing of One‐shot Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/9781119664031.app5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Accelerated Life Testing of One‐shot Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/9781119664031.app5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}