快速、灵敏的内置电流传感器，用于IDDQ测试

Digest of Papers 1996 IEEE International Workshop on IDDQ Testing Pub Date : 1996-10-24 DOI:10.1109/IDDQ.1996.557816

Chih-Wen Lu, Chung-Len Lee, Jwu-E Chen

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引用次数: 19

摘要

在这项工作中，提出了一个快速和高灵敏度的内置电流(BIC)传感器，用于测试静态CMOS芯片。该传感器采用电流反射镜和I-V转换器，实现了高传感速度和高分辨率。电路简单，占地面积小，非常适合集成到IDDQ应用的IC芯片中。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A fast and sensitive built-in current sensor for IDDQ testing

In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

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Digest of Papers 1996 IEEE International Workshop on IDDQ Testing

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