{"title":"高活化温度和低活化温度对阴极射线管热离子氧化物阴极传导的影响","authors":"A. Hashim, A. Ray, D. Barratt, A.K. Hassan","doi":"10.1109/IVNC.2004.1354891","DOIUrl":null,"url":null,"abstract":"The influence of the activation time and temperature on electrical properties of a new type of cathodes was investigated. Electrical results were interpreted in terms of the changes in the surface morphology and composition consequent upon the activation process.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The effect of the high and low activation temperature on the conduction of thermionic oxide cathodes for CRT applications\",\"authors\":\"A. Hashim, A. Ray, D. Barratt, A.K. Hassan\",\"doi\":\"10.1109/IVNC.2004.1354891\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of the activation time and temperature on electrical properties of a new type of cathodes was investigated. Electrical results were interpreted in terms of the changes in the surface morphology and composition consequent upon the activation process.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"81 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2004.1354891\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2004.1354891","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of the high and low activation temperature on the conduction of thermionic oxide cathodes for CRT applications
The influence of the activation time and temperature on electrical properties of a new type of cathodes was investigated. Electrical results were interpreted in terms of the changes in the surface morphology and composition consequent upon the activation process.