深海介质封装中饱和水印刷电路板的击穿

P. Pieterse, Marius Bekker, Saravanakumar Arumugam, D. Uhrlandt
{"title":"深海介质封装中饱和水印刷电路板的击穿","authors":"P. Pieterse, Marius Bekker, Saravanakumar Arumugam, D. Uhrlandt","doi":"10.1109/CEIDP55452.2022.9985301","DOIUrl":null,"url":null,"abstract":"Developments in deep-sea technologies has led to pressure tolerant electrical and electronic systems. These systems do not use pressure resistant enclosures, but instead rely on the encapsulating material to transfer the forces to the embedded components and to provide electrical insulation and protection against water and corrosion. When designing high voltage, high power electronic systems on printed circuit boards (PCBs), the choice of encapsulating material and the integrity of the interfacial boundaries are critical to ensure adequate insulation. In this study, the effect of water ingress on the high voltage breakdown behaviour between two tracks on an encapsulated PCB is investigated. A group of PCBs, with different gaps between their conductive tracks, are encapsulated in an RTV-silicone gel and then immersed in de-ionized-and sea-water respectively to study its breakdown voltage and discharge characteristics over time. Prolonged immersion in deionised water shows a reduction in the breakdown strength between the tracks as well as anomalous breakdown on the rear surface of the PCBs whereas the breakdown behaviour did not change significantly over the evaluation period for the sample immersed in seawater. These results may have been caused by weak bonding between surfaces and the deposition of salts in the outer layer of the test specimens.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"138 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Breakdown of Water Saturated Printed Circuit Boards in Dielectric Encapsulation for Deep-Sea Applications\",\"authors\":\"P. Pieterse, Marius Bekker, Saravanakumar Arumugam, D. Uhrlandt\",\"doi\":\"10.1109/CEIDP55452.2022.9985301\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Developments in deep-sea technologies has led to pressure tolerant electrical and electronic systems. These systems do not use pressure resistant enclosures, but instead rely on the encapsulating material to transfer the forces to the embedded components and to provide electrical insulation and protection against water and corrosion. When designing high voltage, high power electronic systems on printed circuit boards (PCBs), the choice of encapsulating material and the integrity of the interfacial boundaries are critical to ensure adequate insulation. In this study, the effect of water ingress on the high voltage breakdown behaviour between two tracks on an encapsulated PCB is investigated. A group of PCBs, with different gaps between their conductive tracks, are encapsulated in an RTV-silicone gel and then immersed in de-ionized-and sea-water respectively to study its breakdown voltage and discharge characteristics over time. Prolonged immersion in deionised water shows a reduction in the breakdown strength between the tracks as well as anomalous breakdown on the rear surface of the PCBs whereas the breakdown behaviour did not change significantly over the evaluation period for the sample immersed in seawater. These results may have been caused by weak bonding between surfaces and the deposition of salts in the outer layer of the test specimens.\",\"PeriodicalId\":374945,\"journal\":{\"name\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"138 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP55452.2022.9985301\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP55452.2022.9985301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

深海技术的发展导致了耐压电气和电子系统的出现。这些系统不使用耐压外壳,而是依靠封装材料将力传递到嵌入式组件,并提供电气绝缘和防水和腐蚀保护。在印刷电路板(pcb)上设计高电压、高功率电子系统时,封装材料的选择和界面边界的完整性对于确保足够的绝缘至关重要。在这项研究中,水的进入对高压击穿行为的影响在封装PCB上的两个轨道之间进行了研究。一组多氯联苯,其导电轨道之间有不同的间隙,被封装在rtvs硅凝胶中,然后分别浸入去离子水和海水中,研究其击穿电压和放电特性随时间的变化。长时间浸泡在去离子水中显示出轨迹之间击穿强度的降低以及多氯联苯后表面的异常击穿,而浸泡在海水中的样品的击穿行为在评估期间没有显着改变。这些结果可能是由于表面之间的弱结合和试样外层盐的沉积造成的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Breakdown of Water Saturated Printed Circuit Boards in Dielectric Encapsulation for Deep-Sea Applications
Developments in deep-sea technologies has led to pressure tolerant electrical and electronic systems. These systems do not use pressure resistant enclosures, but instead rely on the encapsulating material to transfer the forces to the embedded components and to provide electrical insulation and protection against water and corrosion. When designing high voltage, high power electronic systems on printed circuit boards (PCBs), the choice of encapsulating material and the integrity of the interfacial boundaries are critical to ensure adequate insulation. In this study, the effect of water ingress on the high voltage breakdown behaviour between two tracks on an encapsulated PCB is investigated. A group of PCBs, with different gaps between their conductive tracks, are encapsulated in an RTV-silicone gel and then immersed in de-ionized-and sea-water respectively to study its breakdown voltage and discharge characteristics over time. Prolonged immersion in deionised water shows a reduction in the breakdown strength between the tracks as well as anomalous breakdown on the rear surface of the PCBs whereas the breakdown behaviour did not change significantly over the evaluation period for the sample immersed in seawater. These results may have been caused by weak bonding between surfaces and the deposition of salts in the outer layer of the test specimens.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信