在单个故障定位的最小测试集上

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI:10.1109/EURDAC.1993.410648

Xiao Sun, F. Lombardi, D. Sciuto

{"title":"在单个故障定位的最小测试集上","authors":"Xiao Sun, F. Lombardi, D. Sciuto","doi":"10.1109/EURDAC.1993.410648","DOIUrl":null,"url":null,"abstract":"A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the minimal test set for single fault location\",\"authors\":\"Xiao Sun, F. Lombardi, D. Sciuto\",\"doi\":\"10.1109/EURDAC.1993.410648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<<ETX>>\",\"PeriodicalId\":339176,\"journal\":{\"name\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"volume\":\"116 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURDAC.1993.410648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1993.410648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

提出了一种新的启发式算法(基于故障字典方法)，该算法可以找到最小测试集来定位数字电路中的单个故障(卡滞型)，从而减小故障字典的大小。提出的算法是基于使用二元矩阵的Warshall算法找到测试集中关于功能优势的向量的传递闭包。该算法的空间复杂度为0 (ma)。

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On the minimal test set for single fault location

A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<>

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来源期刊

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference

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