采用分离时钟频率和高速比较器的10位25ms /s SAR ADC的设计

Hiếu Nguyễn Minh, Dang Nguyen Quoc, Trang Hoang
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引用次数: 1

摘要

介绍了一种采用改进型动态比较器的10位25ms /s逐次逼近寄存器(SAR)模数转换器(ADC)的设计。在这种改进的动态比较器中,提出了一种新的前置放大器,与传统的前置放大器结构相比,带宽提高到817 MHz。此外,本文还提出了一种改进的动态锁存器,该锁存器同时驱动栅极和散装终端。整个SAR ADC在180nm CMOS工艺上进行了设计和仿真,其结构基于传统架构,但通过使用分离时钟频率同时控制比较器和SAR组合逻辑来减少电容阵列失配。因此,本设计在时钟频率为0.5 GHz的情况下工作,在1.8V电源电压下实现了25 MS/s的最大采样率。在没有校准技术的情况下,在25 MS/s的采样速度下,原始adc的峰值DNL和峰值INL在整个阵列上的平均值分别为0.7和3.6 LSB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A design of 10-bit 25-MS/s SAR ADC using separated clock frequencies with high speed comparator in 180nm CMOS
A design of a 10-bit 25 MS/s Successive Approximation Register (SAR) Analog to Digital Converter (ADC) that uses improved dynamic comparator has been introduced in this paper. In this improved dynamic comparator, a novel pre-amplifier is proposed in order to enhance the bandwidth up to 817 MHz when compared to classical pre-amplifier structures. Besides, a modified dynamic latch with driving simultaneously gate and bulk terminals are also presented in this work. The whole of SAR ADC is designed and simulated in 180nm CMOS process with the structure based on the conventional architecture but reduced the capacitor array mismatch by using separated clock frequencies to control simultaneously comparator and SAR combination logic. Thus, this design works with the clock frequency of 0.5 GHz achieving a maximum sampling rate at 25 MS/s and 1.8V supply voltage. Without calibration technique, sampling at 25 MS/s, peak DNL and peak INL of original ADCs averaged across the array are 0.7 least significant bit (LSB) and 3.6 LSB, respectively.
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