用于DRAM存储单元自动刷新周期的0.35 um CMOS温度传感器设计

Sehyuk Ann, Junho Yu, Jusang Park, Yongsik Kim, Namsoo Kim
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引用次数: 2

摘要

提出了一种由温度脉冲发生器(TPG)、时间数字转换器(TDC)和频率选择器组成的低功耗CMOS智能温度传感器。多块系统用于获得低功耗存储单元的自刷新操作。温度脉冲发生器(TPG)由两根延迟线组成,延迟线由CMOS逆变器电路获得。CMOS逆变器的传输延迟时间与温度有关。在TDC中采用了基于逆变器的延迟线和反馈拓扑。采用0.35 μm CMOS工艺设计了小尺寸时模温度传感器。在-40 ~ 100°C的温度范围内,可获得6种不同的数字输出。仿真测试表明,该温度传感器的功耗为0.075 μW /个样品,模面积为0.06 mm2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of 0.35 um CMOS Temperature Sensor for Automatic Refresh Cycle in DRAM Memory Cell
This paper proposes a low power CMOS smart temperature sensor which is composed of temperature-to-pulse generator (TPG), time-to-digital converter (TDC), and frequency selector. The multiple-block system is to obtain the self-refresh operation for a low power memory cell. Temperature-to-pulse generator (TPG) is composed with two delay-lines which are obtained by the circuit of CMOS inverter. The propagation delay time of CMOS inverter has a dependency on temperature. The inverter-based delay line and feedback topology are applied in TDC. The small-size time-mode temperature sensor is designed with 0.35-μm CMOS process. Six different digital outputs are obtained for the temperature ranges of -40 ~ 100 °C. Simulation test shows that the proposed temperature sensor is operated with the low power dissipation of 0.075 μW per sample and die-area of 0.06 mm2.
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