{"title":"用高压高分辨电子显微镜研究含tic陶瓷的微观结构现象","authors":"E. Pippel, J. Woltersdorf","doi":"10.1515/9783112578421-032","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":151967,"journal":{"name":"Electron Microscopy in Plasticity and Fracture Research of Materials","volume":"206 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"MICROSTRUCTURAL PHENOMENA OF TiC-CONTAINING CERAMICS STUDIED BY HIGH-VOLTAGE AND HIGH-RESOLUTION ELECTRON MICROSCOPY\",\"authors\":\"E. Pippel, J. Woltersdorf\",\"doi\":\"10.1515/9783112578421-032\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":151967,\"journal\":{\"name\":\"Electron Microscopy in Plasticity and Fracture Research of Materials\",\"volume\":\"206 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electron Microscopy in Plasticity and Fracture Research of Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1515/9783112578421-032\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electron Microscopy in Plasticity and Fracture Research of Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112578421-032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}