线性稳压器LM7805中的脉冲x射线辐照响应:TID积累前后

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745665

Ruibin Li, Chaohui He, Chenhui Wang, Wei Chen, Junlin Li, Xiaoming Jin, Chao Qi, Xiaoyan Bai, Yan Liu, Guizhen Wang

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引用次数: 0

摘要

线性稳压器LM7805首先在Co-60单元中辐照，随后在脉冲x射线辐射环境中辐照。观察并分析了总电离剂量(TID)累积前后脉冲辐照响应的差异。结果表明，累加TID器件的输出电压恢复时间比未累加TID器件的输出电压恢复时间长。基于LM7805电路讨论了TID效应和脉冲辐照响应，并通过分析集成双极结晶体管(BJTs)的电流增益分析了TID对脉冲辐照响应的影响。计算出了影响器件脉冲辐照响应的磁导通路。最后进行了仿真，仿真结果与实验结果吻合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Pulsed X-ray irradiation response in the linear voltage regulator LM7805: before and after TID accumulation

Linear voltage regulators LM7805 are firstly irradiated in a Co-60 unit and subsequently irradiated in a pulsed X-ray radiation environment. The differences of the pulsed-irradiation response before and after total ionizing dose (TID) accumulation are observed and analyzed. The results indicate that the recovery time of the output voltage in the devices accumulating TID is longer than in those pristine ones. The TID effect and pulsed-irradiation response are discussed based on the circuitry of LM7805, and the influence of TID on the pulsed-irradiation response is analyzed via the analysis of the current gain of the integrated bipolar junction transistors (BJTs). The susceptive path for the TID affecting the pulsed-irradiation response in the device is figured out. Finally, simulation is carried out, and the results conform to the experimental results.

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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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