VLSI可测试性设计

{"title":"VLSI可测试性设计","authors":"Edward J. McCluskey","doi":"10.2514/6.1984-2713","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":164639,"journal":{"name":"1984 Symposium on VLSI Technology. Digest of Technical Papers","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"VLSI Design for Testability\",\"authors\":\"Edward J. McCluskey\",\"doi\":\"10.2514/6.1984-2713\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":164639,\"journal\":{\"name\":\"1984 Symposium on VLSI Technology. Digest of Technical Papers\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 Symposium on VLSI Technology. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2514/6.1984-2713\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 Symposium on VLSI Technology. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2514/6.1984-2713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}