{"title":"适用于自由空间材料测量的单端口校准方法","authors":"Jin-Seob Kang","doi":"10.1109/ISAP53582.2022.9998744","DOIUrl":null,"url":null,"abstract":"Accurate and precise measurement of the scattering parameters of a material under test (MUT) is essential for enhancing the measurement uncertainty of material parameter measurement of the MUT. Two one-port calibration methods applicable to a free-space one-port material measurement are described, and their measurement results are compared with those obtained from the two-port TRL method for a glass plate in W-band.","PeriodicalId":137840,"journal":{"name":"2022 International Symposium on Antennas and Propagation (ISAP)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"One-Port Calibration Methods Applicable to Free-Space Material Measurement\",\"authors\":\"Jin-Seob Kang\",\"doi\":\"10.1109/ISAP53582.2022.9998744\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Accurate and precise measurement of the scattering parameters of a material under test (MUT) is essential for enhancing the measurement uncertainty of material parameter measurement of the MUT. Two one-port calibration methods applicable to a free-space one-port material measurement are described, and their measurement results are compared with those obtained from the two-port TRL method for a glass plate in W-band.\",\"PeriodicalId\":137840,\"journal\":{\"name\":\"2022 International Symposium on Antennas and Propagation (ISAP)\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Symposium on Antennas and Propagation (ISAP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAP53582.2022.9998744\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Symposium on Antennas and Propagation (ISAP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAP53582.2022.9998744","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
One-Port Calibration Methods Applicable to Free-Space Material Measurement
Accurate and precise measurement of the scattering parameters of a material under test (MUT) is essential for enhancing the measurement uncertainty of material parameter measurement of the MUT. Two one-port calibration methods applicable to a free-space one-port material measurement are described, and their measurement results are compared with those obtained from the two-port TRL method for a glass plate in W-band.
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