Fei Hu, Limei Song, Zhengsheng Han, Huan Du, Jiajun Luo
{"title":"双n型埋层回跳抑制基极电阻控制晶闸管","authors":"Fei Hu, Limei Song, Zhengsheng Han, Huan Du, Jiajun Luo","doi":"10.1109/EDSSC.2019.8753932","DOIUrl":null,"url":null,"abstract":"A new base resistance controlled thyristor with double N-type buried layer (DNBL-BRT) is proposed in this paper. In the new structure, the left N-buried layer introduces an electron potential trap to extract electron current into thyristor, then effective thyristor trigger current is enhanced. Meanwhile, the right N-buried layer acts as a hole potential barrier to push hole current into P-base region, then parasitic PNP is suppressed and hole current density in P-base region is improved. Snapback phenomenon is significantly suppressed. Numerical simulation results show that, snapback-free can be realized when the doping level of N-buried layers is $1.0 \\times 10^{15}$ $\\mathrm{c m}^{-3}$and the distance between the two N-buried layers is 1.5 $\\mu$m, meanwhile high blocking capability is maintained.","PeriodicalId":183887,"journal":{"name":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Snapback Suppressed Base Resistance Controlled Thyristor with Double N-type Buried Layer\",\"authors\":\"Fei Hu, Limei Song, Zhengsheng Han, Huan Du, Jiajun Luo\",\"doi\":\"10.1109/EDSSC.2019.8753932\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new base resistance controlled thyristor with double N-type buried layer (DNBL-BRT) is proposed in this paper. In the new structure, the left N-buried layer introduces an electron potential trap to extract electron current into thyristor, then effective thyristor trigger current is enhanced. Meanwhile, the right N-buried layer acts as a hole potential barrier to push hole current into P-base region, then parasitic PNP is suppressed and hole current density in P-base region is improved. Snapback phenomenon is significantly suppressed. Numerical simulation results show that, snapback-free can be realized when the doping level of N-buried layers is $1.0 \\\\times 10^{15}$ $\\\\mathrm{c m}^{-3}$and the distance between the two N-buried layers is 1.5 $\\\\mu$m, meanwhile high blocking capability is maintained.\",\"PeriodicalId\":183887,\"journal\":{\"name\":\"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDSSC.2019.8753932\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2019.8753932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Snapback Suppressed Base Resistance Controlled Thyristor with Double N-type Buried Layer
A new base resistance controlled thyristor with double N-type buried layer (DNBL-BRT) is proposed in this paper. In the new structure, the left N-buried layer introduces an electron potential trap to extract electron current into thyristor, then effective thyristor trigger current is enhanced. Meanwhile, the right N-buried layer acts as a hole potential barrier to push hole current into P-base region, then parasitic PNP is suppressed and hole current density in P-base region is improved. Snapback phenomenon is significantly suppressed. Numerical simulation results show that, snapback-free can be realized when the doping level of N-buried layers is $1.0 \times 10^{15}$ $\mathrm{c m}^{-3}$and the distance between the two N-buried layers is 1.5 $\mu$m, meanwhile high blocking capability is maintained.