G. Crupi, Z. Marinković, D. Schreurs, V. Markovic, A. Caddemi
{"title":"多偏置等效电路用于MOSFET建模","authors":"G. Crupi, Z. Marinković, D. Schreurs, V. Markovic, A. Caddemi","doi":"10.1109/TELSKS.2017.8246295","DOIUrl":null,"url":null,"abstract":"We report on the characterization and modelling of a microwave MOSFET. We have characterized the tested on-wafer transistor by measuring DC characteristics and multi-bias scattering parameters up to 40 GHz. Furthermore, we have analytically extracted a small-signal equivalent circuit model that has been extensively and successfully validated against experimental data.","PeriodicalId":206778,"journal":{"name":"2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Multi-bias equivalent circuit for MOSFET modelling\",\"authors\":\"G. Crupi, Z. Marinković, D. Schreurs, V. Markovic, A. Caddemi\",\"doi\":\"10.1109/TELSKS.2017.8246295\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on the characterization and modelling of a microwave MOSFET. We have characterized the tested on-wafer transistor by measuring DC characteristics and multi-bias scattering parameters up to 40 GHz. Furthermore, we have analytically extracted a small-signal equivalent circuit model that has been extensively and successfully validated against experimental data.\",\"PeriodicalId\":206778,\"journal\":{\"name\":\"2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TELSKS.2017.8246295\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TELSKS.2017.8246295","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multi-bias equivalent circuit for MOSFET modelling
We report on the characterization and modelling of a microwave MOSFET. We have characterized the tested on-wafer transistor by measuring DC characteristics and multi-bias scattering parameters up to 40 GHz. Furthermore, we have analytically extracted a small-signal equivalent circuit model that has been extensively and successfully validated against experimental data.