五次泛音AT切割石英晶体的驱动电平依赖性与剩余相位噪声

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) Pub Date : 2000-06-07 DOI:10.1109/FREQ.2000.887359

P. Bates

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引用次数: 8

摘要

目前，在晶体制造行业中，没有一种有效的方法可以在晶体制造过程中选择低噪声的AT切割晶体。驱动电平依赖(DLD)是一个参数，可以很容易地被大多数晶体制造商测量。本文比较了不同厂家固定电参数的五次泛音AT晶体的DLD测量和剩余相位噪声测量。本文还简要讨论了有关低噪声五次泛音AT晶体再现性的晶体制造方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Drive level dependence versus residual phase noise of fifth overtone AT cut quartz crystals

Currently no valid method of choosing low noise AT cut crystals during crystal manufacturing is available within the crystal manufacturing industry. Drive level dependence (DLD) is a parameter, which can be readily measured by most crystal manufacturers. This paper makes a comparison of DLD measurements to residual phase noise measurements of fifth overtone AT crystals with fixed electrical parameters from various manufacturers. A discussion of crystal manufacturing methods pertaining to reproducibility of low noise fifth overtone AT crystals is also briefly discussed.

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Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)

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