{"title":"计算机辅助质量改进","authors":"I. Vuchkov, L. Boyadjieva","doi":"10.1109/CCA.1994.381335","DOIUrl":null,"url":null,"abstract":"The paper presents a method for robust product or process design. The product parameters are so chosen that to minimise the performance characteristic's variance while keeping its mean value on a target. Models of the mean value and variance of the performance characteristic in mass production are given. Two examples are considered: choice of parameters of a Wheatstone bridge and of a band-pass filter.<<ETX>>","PeriodicalId":173370,"journal":{"name":"1994 Proceedings of IEEE International Conference on Control and Applications","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Computer aided quality improvement\",\"authors\":\"I. Vuchkov, L. Boyadjieva\",\"doi\":\"10.1109/CCA.1994.381335\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a method for robust product or process design. The product parameters are so chosen that to minimise the performance characteristic's variance while keeping its mean value on a target. Models of the mean value and variance of the performance characteristic in mass production are given. Two examples are considered: choice of parameters of a Wheatstone bridge and of a band-pass filter.<<ETX>>\",\"PeriodicalId\":173370,\"journal\":{\"name\":\"1994 Proceedings of IEEE International Conference on Control and Applications\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1994 Proceedings of IEEE International Conference on Control and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCA.1994.381335\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1994 Proceedings of IEEE International Conference on Control and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCA.1994.381335","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper presents a method for robust product or process design. The product parameters are so chosen that to minimise the performance characteristic's variance while keeping its mean value on a target. Models of the mean value and variance of the performance characteristic in mass production are given. Two examples are considered: choice of parameters of a Wheatstone bridge and of a band-pass filter.<>