纳米级CMOS电路中自适应体偏置降低漏功率的方案

Jing Yang, Yong-Bin Kim
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引用次数: 6

摘要

本文介绍了在现代纳米级CMOS技术中确定最佳反体偏置(RBB)电压以减小漏电流的技术。本文提出的自适应RBB系统通过比较待机状态下的亚阈值泄漏电流(ISUBTH)、栅极隧道泄漏电流(IGATE)和带间隧道泄漏电流(IBTBT),自适应地找到泄漏功率最小的最佳反向体偏置电压。该电路采用65nm体CMOS技术,在25ºC和小于1V的电源电压下进行了设计和测试。在本文的测试用例中,最佳RBB在-0.372V时达到,误差为1.2%,仿真结果表明,使用所提出的电路技术可以显着降低总泄漏电流,最多可减少总泄漏电流的86%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Self adaptive body biasing scheme for leakage power reduction in nanoscale CMOS circuit
This paper presents techniques to determine the optimal reverse body bias (RBB) voltage to minimize leakage currents in modern nanoscale CMOS technology. The proposed self-adaptive RBB system finds the optimum reverse body bias voltage for minimal leakage power adaptively by comparing subthreshold leakage current (ISUBTH), gate tunneling leakage (IGATE), and band-to-band tunneling leakage currents (IBTBT) in standby mode. The proposed circuit has been designed and tested using 65nm bulk CMOS technology at 25ºC under a supply voltage of less than 1V. The optimal RBB was achieved at -0.372V with 1.2% error in the test case of the paper, and the simulation result shows that it is possible to reduce the total leakage current significantly as much as 86% of the total leakage using the proposed circuit techniques.
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