一种新型功率级与栅极驱动器解耦的SiC器件建模方法

Qing Xin, Han Peng, Zhipeng Cheng, Jimin Chen
{"title":"一种新型功率级与栅极驱动器解耦的SiC器件建模方法","authors":"Qing Xin, Han Peng, Zhipeng Cheng, Jimin Chen","doi":"10.1109/CIEEC50170.2021.9511044","DOIUrl":null,"url":null,"abstract":"Miller capacitor (Cgd) and common source inductor (Lscom) are two major feedback parameters across gate driver loop and power loop for power devices. Silicon Carbide (SiC) power transistors have fast switching speed but are more inclined to be affected by parasitics, such as overshoots, oscillations and cross-talk. To ensure a reliable and efficient SiC switching, the impacts of miller capacitor and common source inductor need to be identified and quantified. Since these two parameters are coupled between two loops, a comprehensive analytical analysis is quite complicated and requires massive computation. Therefore, a novel SiC device modeling based upon Cgd and Lscom decoupling is proposed. By extracted the equivalent model for Cgd and Lscom at different switching intervals, gate driver loop and main power loop can be fully decoupled. By doing so, the designs and optimizations for the two loops will be more straightforward and precise. With the proposed decoupling modeling approach, the decoupled equivalent circuit is verified to have descent accuracy in predicting the actual SiC switching transients.","PeriodicalId":110429,"journal":{"name":"2021 IEEE 4th International Electrical and Energy Conference (CIEEC)","volume":"250 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Novel SiC Device Modeling With Power Stage and Gate Driver Decoupling\",\"authors\":\"Qing Xin, Han Peng, Zhipeng Cheng, Jimin Chen\",\"doi\":\"10.1109/CIEEC50170.2021.9511044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Miller capacitor (Cgd) and common source inductor (Lscom) are two major feedback parameters across gate driver loop and power loop for power devices. Silicon Carbide (SiC) power transistors have fast switching speed but are more inclined to be affected by parasitics, such as overshoots, oscillations and cross-talk. To ensure a reliable and efficient SiC switching, the impacts of miller capacitor and common source inductor need to be identified and quantified. Since these two parameters are coupled between two loops, a comprehensive analytical analysis is quite complicated and requires massive computation. Therefore, a novel SiC device modeling based upon Cgd and Lscom decoupling is proposed. By extracted the equivalent model for Cgd and Lscom at different switching intervals, gate driver loop and main power loop can be fully decoupled. By doing so, the designs and optimizations for the two loops will be more straightforward and precise. With the proposed decoupling modeling approach, the decoupled equivalent circuit is verified to have descent accuracy in predicting the actual SiC switching transients.\",\"PeriodicalId\":110429,\"journal\":{\"name\":\"2021 IEEE 4th International Electrical and Energy Conference (CIEEC)\",\"volume\":\"250 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 4th International Electrical and Energy Conference (CIEEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CIEEC50170.2021.9511044\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 4th International Electrical and Energy Conference (CIEEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIEEC50170.2021.9511044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

米勒电容(Cgd)和共源电感(Lscom)是功率器件跨栅极驱动环和功率环的两个主要反馈参数。碳化硅(SiC)功率晶体管开关速度快,但易受过调、振荡、串扰等寄生效应的影响。为了确保可靠和高效的SiC开关,需要识别和量化米勒电容器和共源电感的影响。由于这两个参数在两个循环之间是耦合的,全面的解析分析是非常复杂的,需要大量的计算。为此,提出了一种基于Cgd和Lscom解耦的新型SiC器件建模方法。通过提取不同开关间隔下Cgd和Lscom的等效模型,实现栅极驱动环和主功率环的完全解耦。通过这样做,两个循环的设计和优化将更加直接和精确。利用所提出的解耦建模方法,验证了解耦等效电路在预测实际SiC开关瞬态时具有下降精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Novel SiC Device Modeling With Power Stage and Gate Driver Decoupling
Miller capacitor (Cgd) and common source inductor (Lscom) are two major feedback parameters across gate driver loop and power loop for power devices. Silicon Carbide (SiC) power transistors have fast switching speed but are more inclined to be affected by parasitics, such as overshoots, oscillations and cross-talk. To ensure a reliable and efficient SiC switching, the impacts of miller capacitor and common source inductor need to be identified and quantified. Since these two parameters are coupled between two loops, a comprehensive analytical analysis is quite complicated and requires massive computation. Therefore, a novel SiC device modeling based upon Cgd and Lscom decoupling is proposed. By extracted the equivalent model for Cgd and Lscom at different switching intervals, gate driver loop and main power loop can be fully decoupled. By doing so, the designs and optimizations for the two loops will be more straightforward and precise. With the proposed decoupling modeling approach, the decoupled equivalent circuit is verified to have descent accuracy in predicting the actual SiC switching transients.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信