新颖的双电平t型栅极技术

A. Fox, M. Mikulics, H. Hardtdegen, S. Trellenkamp, Y. Arango, D. Grutzmacher, Zdenek Sofer, D. Gregušová, J. Novák, P. Kordos, M. Marso
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引用次数: 0

摘要

我们开发了一种新的基于湿法蚀刻金属栅极中间层的双电平t型栅极技术。在此工艺的帮助下,我们制备了宽度小至200nm的t型栅脚。我们的工艺的主要优点是它只使用标准光学光刻。它允许为晶体管制造100纳米尺寸的t栅极。采用初始栅极长度Lg为2 μm的AlGaN/GaN/蓝宝石材料结构制备了高电子迁移率晶体管(hemt)。通过将栅极蚀刻成200 nm长度的双t栅极触点,将其截止频率从6 GHz提高到60 GHz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel double-level-T-gate technology
We developed a novel double-level-T-gate technology based on wet etching of a metal gate interlayer. With the help of this technological process we prepared T-gate feet with widths as small as 200 nm. The major advantage of our process is its use of only standard optical lithography. It allows the fabrication of 100 nanometer size T-gates for transistors. High electron mobility transistors (HEMTs) were fabricated on an AlGaN/GaN/sapphire material structure with an original gate length Lg of 2 μm. Their cutoff frequency of 6 GHz was improved to 60 GHz by etching the gate to a 200 nm length double T-gate contact.
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