{"title":"纳米CMOS技术中的模拟设计挑战","authors":"W. Sansen","doi":"10.1109/ASSCC.2007.4425792","DOIUrl":null,"url":null,"abstract":"This paper provides a review of all important effects in nm CMOS technologies, with 1 volt supply voltages. They are the reduction of the transconduction, the increase of the gate current, the noise and the mismatch. It is followed by an overview of amplifiers/filters configurations with both Gate and Bulk drives. A large number of sub-1 volt circuits are then provided for sake of illustration, including sigma-delta modulators.","PeriodicalId":186095,"journal":{"name":"2007 IEEE Asian Solid-State Circuits Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"Analog design challenges in nanometer CMOS technologies\",\"authors\":\"W. Sansen\",\"doi\":\"10.1109/ASSCC.2007.4425792\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper provides a review of all important effects in nm CMOS technologies, with 1 volt supply voltages. They are the reduction of the transconduction, the increase of the gate current, the noise and the mismatch. It is followed by an overview of amplifiers/filters configurations with both Gate and Bulk drives. A large number of sub-1 volt circuits are then provided for sake of illustration, including sigma-delta modulators.\",\"PeriodicalId\":186095,\"journal\":{\"name\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2007.4425792\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2007.4425792","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analog design challenges in nanometer CMOS technologies
This paper provides a review of all important effects in nm CMOS technologies, with 1 volt supply voltages. They are the reduction of the transconduction, the increase of the gate current, the noise and the mismatch. It is followed by an overview of amplifiers/filters configurations with both Gate and Bulk drives. A large number of sub-1 volt circuits are then provided for sake of illustration, including sigma-delta modulators.