{"title":"电磁干扰的统计方法——理论与实验第二部分","authors":"D. Weiner, G. Capraro","doi":"10.1109/ISEMC.1987.7570815","DOIUrl":null,"url":null,"abstract":"With reference to the experiment described in Part 1, the crosstalk and second-order nonlinear transfer function data are analyzed to obtain approximations for the associated probability density functiońs. These are combined to obtain the probability density function for the susceptibility level of the printed circuit board (PCB). Finally, the data related to lighting the light emitting diode (LED) are analyzed for statistical consistency with the theoretically derived susceptibility density function.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A Statistical Approach to EMI - Theory and Experiment Part II\",\"authors\":\"D. Weiner, G. Capraro\",\"doi\":\"10.1109/ISEMC.1987.7570815\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With reference to the experiment described in Part 1, the crosstalk and second-order nonlinear transfer function data are analyzed to obtain approximations for the associated probability density functiońs. These are combined to obtain the probability density function for the susceptibility level of the printed circuit board (PCB). Finally, the data related to lighting the light emitting diode (LED) are analyzed for statistical consistency with the theoretically derived susceptibility density function.\",\"PeriodicalId\":443616,\"journal\":{\"name\":\"1987 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1987 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1987.7570815\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1987.7570815","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Statistical Approach to EMI - Theory and Experiment Part II
With reference to the experiment described in Part 1, the crosstalk and second-order nonlinear transfer function data are analyzed to obtain approximations for the associated probability density functiońs. These are combined to obtain the probability density function for the susceptibility level of the printed circuit board (PCB). Finally, the data related to lighting the light emitting diode (LED) are analyzed for statistical consistency with the theoretically derived susceptibility density function.