质子损伤对P通道和n通道ccd影响的比较I:低温辐照后的性能(会议报告)

N. Bush, B. Dryer, Anton Lindley De-Caire, R. Burgon, A. Holland
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引用次数: 7

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A comparison of proton damage effects on P- and N-Channel CCDs I: performance following cryogenic irradiation (Conference Presentation)
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