基于奇偶码的低功耗CED电路的合成

Shalini Ghosh, Sugato Basu, N. Touba
{"title":"基于奇偶码的低功耗CED电路的合成","authors":"Shalini Ghosh, Sugato Basu, N. Touba","doi":"10.1109/VTS.2005.80","DOIUrl":null,"url":null,"abstract":"An automated design procedure is described for synthesizing circuits with low power concurrent error detection. It is based on pre-synthesis selection of a parity-check code followed by structure constrained logic optimization that produces a circuit in which all single point faults are guaranteed to be detected. Two new contributions over previous work include (1) the use of a k-way partitioning algorithm combined with local search to select a parity-check code, and (2) a methodology for minimizing power consumption in the CED circuitry. Results indicate significant reductions in area overhead due to the new code selection procedure as well as the ability to find low power implementations for use in power conscious applications.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"7 Suppl 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"45","resultStr":"{\"title\":\"Synthesis of low power CED circuits based on parity codes\",\"authors\":\"Shalini Ghosh, Sugato Basu, N. Touba\",\"doi\":\"10.1109/VTS.2005.80\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An automated design procedure is described for synthesizing circuits with low power concurrent error detection. It is based on pre-synthesis selection of a parity-check code followed by structure constrained logic optimization that produces a circuit in which all single point faults are guaranteed to be detected. Two new contributions over previous work include (1) the use of a k-way partitioning algorithm combined with local search to select a parity-check code, and (2) a methodology for minimizing power consumption in the CED circuitry. Results indicate significant reductions in area overhead due to the new code selection procedure as well as the ability to find low power implementations for use in power conscious applications.\",\"PeriodicalId\":268324,\"journal\":{\"name\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"volume\":\"7 Suppl 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"45\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2005.80\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 45

摘要

介绍了一种具有低功耗并发错误检测的合成电路的自动化设计方法。它是基于奇偶校验码的预合成选择,然后进行结构约束逻辑优化,从而产生保证检测到所有单点故障的电路。与之前的工作相比,两个新的贡献包括:(1)使用k-way划分算法结合局部搜索来选择奇偶校验码,以及(2)一种最小化CED电路功耗的方法。结果表明,由于新的代码选择过程以及在功耗敏感应用中找到低功耗实现的能力,面积开销显着减少。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Synthesis of low power CED circuits based on parity codes
An automated design procedure is described for synthesizing circuits with low power concurrent error detection. It is based on pre-synthesis selection of a parity-check code followed by structure constrained logic optimization that produces a circuit in which all single point faults are guaranteed to be detected. Two new contributions over previous work include (1) the use of a k-way partitioning algorithm combined with local search to select a parity-check code, and (2) a methodology for minimizing power consumption in the CED circuitry. Results indicate significant reductions in area overhead due to the new code selection procedure as well as the ability to find low power implementations for use in power conscious applications.
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