{"title":"自动三根阻抗匹配系统中的短根交换","authors":"V. Bilik","doi":"10.1109/COMITE.2013.6545069","DOIUrl":null,"url":null,"abstract":"The paper explains the nature of the stub swapping phenomenon in three-stub automatic impedance matching systems and points out problems it causes in high-power industrial autotuners. A method of quantifying consequences of stub swapping is proposed and illustrated by a simulation example. Two possible ways of suppressing the adverse effects of the stub swapping are suggested.","PeriodicalId":372048,"journal":{"name":"2013 Conference on Microwave Techniques (COMITE)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Stub swapping in automatic three-stub impedance matching systems\",\"authors\":\"V. Bilik\",\"doi\":\"10.1109/COMITE.2013.6545069\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper explains the nature of the stub swapping phenomenon in three-stub automatic impedance matching systems and points out problems it causes in high-power industrial autotuners. A method of quantifying consequences of stub swapping is proposed and illustrated by a simulation example. Two possible ways of suppressing the adverse effects of the stub swapping are suggested.\",\"PeriodicalId\":372048,\"journal\":{\"name\":\"2013 Conference on Microwave Techniques (COMITE)\",\"volume\":\"97 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 Conference on Microwave Techniques (COMITE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMITE.2013.6545069\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Conference on Microwave Techniques (COMITE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMITE.2013.6545069","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stub swapping in automatic three-stub impedance matching systems
The paper explains the nature of the stub swapping phenomenon in three-stub automatic impedance matching systems and points out problems it causes in high-power industrial autotuners. A method of quantifying consequences of stub swapping is proposed and illustrated by a simulation example. Two possible ways of suppressing the adverse effects of the stub swapping are suggested.