随机存取存储器中非链接静态故障的最小March测试

Gurgen Harutunyan, V. Vardanian, Y. Zorian
{"title":"随机存取存储器中非链接静态故障的最小March测试","authors":"Gurgen Harutunyan, V. Vardanian, Y. Zorian","doi":"10.1109/VTS.2005.56","DOIUrl":null,"url":null,"abstract":"New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"56","resultStr":"{\"title\":\"Minimal March tests for unlinked static faults in random access memories\",\"authors\":\"Gurgen Harutunyan, V. Vardanian, Y. Zorian\",\"doi\":\"10.1109/VTS.2005.56\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).\",\"PeriodicalId\":268324,\"journal\":{\"name\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"56\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2005.56\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.56","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 56

摘要

提出了一种新的最小三月测试算法,用于检测随机存储器中的(所有)非链接静态故障。特别是,引入了一种新的最小复杂度I8N的March MSS测试,用于检测所有实际的简单静态故障,如March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Minimal March tests for unlinked static faults in random access memories
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).
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