{"title":"结合部分顺序和符号遍历的有效验证异步电路","authors":"A. Semenov, A. Yakovlev","doi":"10.1109/ASPDAC.1995.486371","DOIUrl":null,"url":null,"abstract":"We propose an algorithm combining two approaches to PN verification: PN unfolding and BDD-based traversal. We introduce a new application of the PN unfolding method. The results of unfolding construction are used for obtaining the close-to-optimal ordering of BDD variables. The effect of this combination is demonstrated on a set of benchmarks. The overall framework has been used for the verification of circuits in an asynchronous microprocessor.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"939 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Combining partial orders and symbolic traversal for efficient verification of asynchronous circuits\",\"authors\":\"A. Semenov, A. Yakovlev\",\"doi\":\"10.1109/ASPDAC.1995.486371\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose an algorithm combining two approaches to PN verification: PN unfolding and BDD-based traversal. We introduce a new application of the PN unfolding method. The results of unfolding construction are used for obtaining the close-to-optimal ordering of BDD variables. The effect of this combination is demonstrated on a set of benchmarks. The overall framework has been used for the verification of circuits in an asynchronous microprocessor.\",\"PeriodicalId\":119232,\"journal\":{\"name\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"volume\":\"939 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.1995.486371\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Combining partial orders and symbolic traversal for efficient verification of asynchronous circuits
We propose an algorithm combining two approaches to PN verification: PN unfolding and BDD-based traversal. We introduce a new application of the PN unfolding method. The results of unfolding construction are used for obtaining the close-to-optimal ordering of BDD variables. The effect of this combination is demonstrated on a set of benchmarks. The overall framework has been used for the verification of circuits in an asynchronous microprocessor.
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