V. Vadalà, A. Raffo, K. Kikuchi, Hiroshi Yamamoto, G. Bosi, Kazutaka Inoue, N. Ui, G. Vannini
{"title":"后退操作下精度提高的GaN HEMT模型","authors":"V. Vadalà, A. Raffo, K. Kikuchi, Hiroshi Yamamoto, G. Bosi, Kazutaka Inoue, N. Ui, G. Vannini","doi":"10.23919/EuMIC.2019.8909567","DOIUrl":null,"url":null,"abstract":"In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.","PeriodicalId":228725,"journal":{"name":"2019 14th European Microwave Integrated Circuits Conference (EuMIC)","volume":"14 2","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"GaN HEMT Model with Enhanced Accuracy under Back-off Operation\",\"authors\":\"V. Vadalà, A. Raffo, K. Kikuchi, Hiroshi Yamamoto, G. Bosi, Kazutaka Inoue, N. Ui, G. Vannini\",\"doi\":\"10.23919/EuMIC.2019.8909567\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.\",\"PeriodicalId\":228725,\"journal\":{\"name\":\"2019 14th European Microwave Integrated Circuits Conference (EuMIC)\",\"volume\":\"14 2\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 14th European Microwave Integrated Circuits Conference (EuMIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EuMIC.2019.8909567\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 14th European Microwave Integrated Circuits Conference (EuMIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EuMIC.2019.8909567","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
GaN HEMT Model with Enhanced Accuracy under Back-off Operation
In this paper, a modification of the Angelov DC I/V model is proposed with the aim of improving its accuracy in the back-off condition under Class-B operation yet preserving its excellent prediction capabilities under high output power and saturated operations. Dispersion effects and capacitances are modelled by well-established techniques. As validation, the predictions of the model on S-parameters and load-pull circles at different bias conditions and different input power levels are shown.