采用MIL-HDBK-217F和FIDES方法对紧凑型荧光灯电子电路进行可靠性分析

P. Prodanov, D. Dankov
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引用次数: 3

摘要

电子元件的主要可靠性指标之一故障率的计算有几种指导性方法。通常,方法分为三组:乘性pi因子方法、加性pi因子方法和组合方法。本文比较了MIL-HDBK-217F和FIDES两种方法的结果和适用性,这两种方法在过去几年中已经确立了自己的基本方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability Analysis of Electronic Circuit of Compact FIuorescent Lamp using Methods MIL-HDBK-217F and FIDES
There are several guiding methods for calculating one of the main reliability indicators-failure rate of electronic components. Generally, methods are divided into three groups: methods with multiplicative pi-factors, methods with additive pi-factors and combined methods. The present paper compares the results and applicability of two methods - MIL-HDBK-217F and FIDES, which over the last years have established themselves as basic methods.
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