产品开发对缺陷生命周期的影响

R. Ramler
{"title":"产品开发对缺陷生命周期的影响","authors":"R. Ramler","doi":"10.1145/1390817.1390823","DOIUrl":null,"url":null,"abstract":"This paper investigates the defects of a large embedded software development project over a period of about two years. It describes how software development and product development are organized in parallel branches. By mapping the defects reported on product development branches to the releases on the main line of software development, the paper shows the impact of the product development strategy on the defect lifecycle in software development.","PeriodicalId":193694,"journal":{"name":"DEFECTS '08","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"The impact of product development on the lifecycle of defects\",\"authors\":\"R. Ramler\",\"doi\":\"10.1145/1390817.1390823\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper investigates the defects of a large embedded software development project over a period of about two years. It describes how software development and product development are organized in parallel branches. By mapping the defects reported on product development branches to the releases on the main line of software development, the paper shows the impact of the product development strategy on the defect lifecycle in software development.\",\"PeriodicalId\":193694,\"journal\":{\"name\":\"DEFECTS '08\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DEFECTS '08\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1390817.1390823\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DEFECTS '08","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1390817.1390823","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

本文对一个大型嵌入式软件开发项目进行了为期两年的缺陷调查。它描述了如何在并行分支中组织软件开发和产品开发。通过将产品开发分支上报告的缺陷映射到软件开发主线上的发布,本文展示了产品开发策略对软件开发中缺陷生命周期的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The impact of product development on the lifecycle of defects
This paper investigates the defects of a large embedded software development project over a period of about two years. It describes how software development and product development are organized in parallel branches. By mapping the defects reported on product development branches to the releases on the main line of software development, the paper shows the impact of the product development strategy on the defect lifecycle in software development.
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