{"title":"基于特征匹配网络和可变负载的负载-拉力测量(UHF双极晶体管)","authors":"W. Chan, C. Fan, P. Yip","doi":"10.1109/CICCAS.1991.184369","DOIUrl":null,"url":null,"abstract":"Load-pull measurements are traditionally performed using stub tuners which can be unreliable and difficult to use. The authors present a method which minimises the use of stub tuners, and by using characterised components reduces the measurement time considerably.<<ETX>>","PeriodicalId":119051,"journal":{"name":"China., 1991 International Conference on Circuits and Systems","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Load-pull measurements using characterised matching network and variable load (UHF bipolar transistors)\",\"authors\":\"W. Chan, C. Fan, P. Yip\",\"doi\":\"10.1109/CICCAS.1991.184369\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Load-pull measurements are traditionally performed using stub tuners which can be unreliable and difficult to use. The authors present a method which minimises the use of stub tuners, and by using characterised components reduces the measurement time considerably.<<ETX>>\",\"PeriodicalId\":119051,\"journal\":{\"name\":\"China., 1991 International Conference on Circuits and Systems\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"China., 1991 International Conference on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICCAS.1991.184369\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"China., 1991 International Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICCAS.1991.184369","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Load-pull measurements using characterised matching network and variable load (UHF bipolar transistors)
Load-pull measurements are traditionally performed using stub tuners which can be unreliable and difficult to use. The authors present a method which minimises the use of stub tuners, and by using characterised components reduces the measurement time considerably.<>
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